ligitek electronics co.,ltd. property of ligitek only LUY4333 doc. no : qw0905- rev. : date : data sheet super bright cylindrical type led lamps a - 2005 03 - mar LUY4333
directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. package dimensions ligitek electronics co.,ltd. property of ligitek only 25% 75% 100% 50% -60 x -30 x 75% 25% 050%100% 0 x 30 x 60 x LUY4333 part no. 1/4 page 0.5 typ 25.0min + - 1.0min 2.54typ 6.8 1.5max 5.0
typical electrical & optical characteristics (ta=25 j ) symbol esd tsol t opr tstg i f pd i fp absolute maximum ratings at ta=25 j note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. color water clear operating temperature part no material algainp LUY4333 yellow emitted soldering temperature storage temperature part no. forward current electrostatic discharge reverse current @5v peak forward current duty 1/10@10khz power dissipation parameter -40 ~ +85 20 forward voltage @20ma(v) wave length f nm spectral halfwidth ??f nm viewing angle 2 c 1/2 (deg) luminous intensity @ ma(mcd) typ. 15 595 lens d 1.7 160 2.6 max. min. min. 88 250 dominant max 260 j for 5 sec max (2mm from body) -40 ~ +100 j j 2/4 page ma 50 ir 2000 10 120 90 v g a ma mw ratings uy unit ligitek electronics co.,ltd. property of ligitek only LUY4333
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity @20ma wavelength (nm) forward voltage@20ma normaliz @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity @20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0 0.5 530 2.0 3.0 4.0 5.0 0.8 40 -20 -40 80 100 60 0 0.5 1.0 1.5 2.0 0.9 1.2 1.0 1.1 1.0 1.5 2.0 2.5 580 630 680 0 0.5 1.0 2.5 3.0 20 0 20 -40 0 -20 80 40 60 100 3.0 uy chip part no. 3/4 page LUY4333
mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solderability test this test intended to see soldering well performed or not. 1.ta=65 j? 5 j 2.rh=90 %~95 % 3.t=240hrs ? 2hrs 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles solder resistance test thermal shock test high temperature high humidity test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hous. 4/4 page part no. jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) low temperature storage test high temperature storage test operating life test the purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. test condition test item reliability test: description reference standard ligitek electronics co.,ltd. property of ligitek only LUY4333
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